4: Pulse card concepts Model 4200A-SCS Pulse Card (PGU and PMU)
4-8 4200A-PMU-900-01 Rev. B March 2023
Pulse source-measure concepts
Ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many
technologies, including compound semiconductors, medium-power devices, nonvolatile memory,
microelectromechanical systems (MEMs), nanodevices, solar cells, and CMOS devices. Using pulsed
I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the
effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due
to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra
high-speed current or voltage waveforms in the time domain or to study dynamic test circuits. Pulsed
sourcing can be used to stress test a device using an AC signal during reliability cycling or in a
multi-level waveform mode to program or erase memory devices. The 4225-PMU Ultra-Fast I-V
Module for the 4200A-SCS supports many of these high-speed sourcing and
measurement applications.
Ultra-fast I-V tests
You can use the 4225-PMU to do these types of ultra-fast I-V tests:
• Pulsed I-V
• Transient I-V
• Pulsed sourcing
Pulsed I-V tests
Pulsed I-V tests are tests with a pulsed source and a corresponding high speed, timed-based
measurement that provides dc-like results. The current plus voltage measurement is an average of
readings made in a predefined measurement window on the pulse. This average of readings is called
the spot mean. You can define the parameters of the pulse, including the pulse width, duty cycle, rise
and fall times, and amplitude. You can use the train, sweep, or step mode.
Using pulsed I-V signals to characterize devices instead of dc signals makes it possible to study or
reduce the effects of self-heating (Joule heating) or to minimize current drift or degradation in
measurements due to trapped charge.
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