-SCS Pulse Card (PGU and PMU) User's Manual Section 4:
4200A-PMU-900-01 Rev. B March 2023 4-9
Figure 79: Pulsed I-V tests
Transient I-V tests
Transient I-V, or waveform capture, is a time-based current or voltage measurement that is typically
the capture of a pulsed waveform. A transient test is typically a single pulse waveform that is used to
study time-varying parameters, such as the drain current degradation versus time due to charge
trapping or self-heating. Transient I-V measurements can be made to test a dynamic test circuit or
can be used as a diagnostic tool for choosing the appropriate pulse settings in the pulsed I-V mode.
Figure 80: Transient I-V tests
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