-SCS Pulse Card (PGU and PMU) User's Manual Section 8:
4200A-PMU-900-01 Rev. B March 2023 8-9
Figure 162: Example results of voltage threshold shift in an Endurance test on a NOR flash cell
Connections for endurance testing - no switching matrix
For a direct connect configuration, the minimum number of pulse channels is equal to the number of
DUT terminals that need to be simultaneously pulsed, including terminals that must change from
connected to disconnected, or open, states for either the program or erase condition.
The following connection configuration does not require a switching matrix. It provides four channels
of pulse and four SMUs to permit full characterization of single (nonarray) NVM DUT. This connection
method is used for both the initial program/erase investigation and endurance testing of a
directly-connected DUT.
All interconnects on instrument chassis are white SMA cables. Cables from the instrument to device
are BNC coaxial. Use triaxial to BNC adapters if necessary to connect to probe manipulators.
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