8: Testing flash memory Model 4200A-SCS Pulse Card (PGU and PMU)
8-14 4200A-PMU-900-01 Rev. B March 2023
Using a switching matrix
A limitation of the no-switching, direct connect test configuration shown in the following figure is that
only three devices can be measured. The test must be manually reconfigured or recabled to test
other devices.
Without a switching matrix, the number of adjacent cells that can be measured is limited. Therefore, it
is recommended that a switching matrix be used for disturb testing.
Using a switching matrix allows the flexibility of routing pulse and dc signals without having to make
connection changes. Also, this type of structure uses a multipin probe card, which provides an
additional opportunity for mapping test resources to DUT pins. For example, a SMU can be shared
across multiple device terminals where the required voltage is the same.
Figure 166: Disturb testing - configuration to test a single device
Use KPulse to create and export Segment Arb waveforms
This example demonstrates how to create a program and erase waveform using the KPulse flash
example file.
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