HP 8753E - On-Wafer Measurements

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On-Wafer Measurements

Hewlett-Packard Company, “On-Wafer Measurements Using the HP 8510 Network Analyzer and

Cascade Microtech Wafer Probes,” Product Note 8510-6 HP publication number

5054-1570

Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, “Advancements in On-Wafer Probing

Calibration Techniques,

Hewlett-Packard RF and Microwave Measurement Symposium paper,

1991

Lautzenhiser, S., A. Davidson, D. Jones, “Improve Accuracy of On-Wafer Tests Via

LRM

Calibration,” Reprinting from “Microwaves and RF” HP publication number

5052-1286,

January

1990

“On-Wafer Calibration: Practical Considerations,

8510/8720

News HP publication number

5001-6837,

February 1993

6-172

Application and Operation

Conoepts

Other manuals for HP 8753E