single
bus concept, 11-20
analyzer description,
l-2
analyzer display
measurement setup diagram, 3-31
annotations of display, 1-8
anti-static mat, 7-20
application and operation concepts,
6-l
applications
amplifier testing, 6-153-156
mixer testing, 6-157-168
on-wafer measurements, 2-91
arrays
flexibiity, 4-36
format, 6-7
format , 4-36
raw data , 4-36
ASCII data formats, 4-39
assign classes, 5-30, 5-32
atmospheric conditions, 7-20
ATN (attention) control
line,
11-18
attention (ATN) control
line,
11-18
attenuation at mixer ports, 3-2
attenuator, 6-2
allowing repetitive switching, 6-20
-.
switch protection, 6-20
.~~~~~~
4-
12
. . . .
>
. . . . . . . . .
7
“:~~~~~
..:.
~~~~~
use, 4-5
;>u;=;
. . . . . . .
...=
;;;; .
. . . . . . .
...=
_
. . . . . . . . . . . . . . . . . . . . . . .
i
_............
automated measurements, 6-146-152
automatic
file
naming convention for
LIF
format, 419
auto sweep time mode
how to set, 5-51
auxihary
channel, 2-10
auxiliary channels, 6-8
enabling, 6-42
auxihary
channels;stimuIus
coupling, 6-43
auxiliary input connector location, 1-12
available options, 1-13
averaging, 6-51
changes, 5-56
sweep-to-sweep, 6-5
averaging factor
how to widen, 5-52
&).
key, 6-51
m
menu map, 8-2
Avg status notation,
l-8
&key, 6-11
bandpass
mode
fault location measurements, 6-131
reflection measurements, 6-127
transmission measurements, 6-129
band switch points, 5-51
bandwidth
system:how to widen, 5-52
basic measurement sequence and example,
2-3
basic
taiker
(T6),
11-19
battery backup for memory, 12-2
battery
life,
4-33
bias inputs and fuses locations, 1-12
bidirectional
lines,
11-17
blanking the display, 6-49
broad band power meter calibration
connections,
3-
13
bus
device modes, 11-20
structure, 11-16, 11-17
C
Cl0
(pass control
capabihties),
11-19
Cl,C2,C3
(system controller capabilities),
11-19
C2
status notation, l-8
cabinet, 1
l-4
cabinet dimensions, 7-2 1
cables
HP-IB, 1
l-5
interconnecting, 5-2
interface, 1
l-5
test port return, 11-2
calculate statistics of the measurement data,
2-36
calibrate menu, 6-80
calibrating
noninsertable devices, 5-46
calibration
concepts, 6-57-109
considerations, 6-72
data lost, 12-2
device measurements, 6-72
fast
2-port,
5-54
for mixer measurements, 3-6
for noninsertable devices, 5-40, 6-109
fulI
two-port, 6-80
in memory, 12-2
interpolated error-correction, 6-79
measurement parameters, 6-72
modifying kits, 6-83
omitting isolation, 6-72
one-port, 6-80
power meter, 5-34, 6-102
procedure to modify a user kit, 6-83
receiver, 5-12
response, 6-80
response and isolation, 6-80
restarting, 6-82
saving data, 6-72
Index-2
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