I2773-4.4 en
219
Somat eDAQ
lite
16 Xth-Percentile Benchmark Tests
The following benchmark tests give an indication of the eDAQ
lite
processing
limitations for the special case of using the Xth-percentile mode of the Statistical
Analysis computed channel. The primary reason for this benchmark testing is that
sorting large arrays can become very time consuming as the size of the arrays
increase.
All of the tests have the following configuration properties.
•
An input data signal using a function generator to produce highly unordered
data where nearly every data sample represents a reversal as shown in the plot
below.
Figure 16-1:
Plot of the input signal to the eDAQ
lite
as sampled by a test bridge channel.
•
Four bridge channels with 32-bit float output data types.
•
Twelve Statistical Analysis computed channels using the Xth-percentile mode to
compute the 10%, 50% and 90% percentile values for each of the four bridge
channels.
•
Two Time History DataModes: one to store the four bridge channels and the
other to store the twelve Xth-percentile mode Statistical Analysis computed
channels.
•
All data storage in the eDAQ
lite
internal flash memory.
After some preliminary testing, the following four tests were performed for final
benchmarking. The only varied parameters were the bridge channel sample rate and
the size of the Statistical Analysis channel analysis window.
HBM: public
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