Model 4200A-SCS Pulse Card (PGU and PMU)
Run the test ............................................................................................................................. 6-15
View and analyze the test results ............................................................................................ 6-15
PMU for pulsed I-V measurements on a MOSFET ................................................. 7-1
Introduction .......................................................................................................................... 7-1
Equipment required .............................................................................................................. 7-2
Device connections .............................................................................................................. 7-2
Connection schematic ............................................................................................................... 7-3
Set up the measurements in Clarius .................................................................................... 7-4
Create a new project ................................................................................................................. 7-5
Search for and select an existing test ....................................................................................... 7-5
Configure the test ...................................................................................................................... 7-6
Run the test and analyze the results ......................................................................................... 7-8
Testing flash memory .............................................................................................. 8-1
Testing flash memory ........................................................................................................... 8-1
Flash connection guidelines ................................................................................................. 8-2
Programming and erasing flash memory .................................................................................. 8-3
Endurance testing ................................................................................................................ 8-8
Connections for endurance testing - no switching matrix .......................................................... 8-9
Connections for endurance testing - switching matrix ............................................................. 8-11
Disturb testing .................................................................................................................... 8-12
Connections for disturb testing ................................................................................................ 8-12
Using a switching matrix .................................................................................................... 8-14
Use KPulse to create and export Segment Arb waveforms............................................... 8-14
Enter Segment Arb values into UTM array parameters ..................................................... 8-16
Direct connections to single DUT ....................................................................................... 8-17
Direct connections to array DUT for disturb testing ........................................................... 8-19