Hioki RM3542 - 4.8 Test for Short-Circuited Probe

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)
52
Probe Short-Circuit Detection Enable/Disable
1
Open the Basic Settings screen.
2
Open the System screen.
3
Enable or disable the function.
4
(When enabled (ON selected))
Set the probe detection timing.
5
Return to the Measurement screen.
The Basic Settings screen appears.
The System screen appears.
[SYSTEM]
1
Selection
2
Selection
1
2
Disables the function (default)
(go to step 5)
Enables the function
Selection
1
2
Setting range: 1 to 100 ms, 5 ms (default)
Short-circuit detection is delayed for the speci-
fied time following the end of measurement.
3
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.