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Hioki RM3542 User Manual

Hioki RM3542
218 pages
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RESISTANCE HiTESTER
Instruction Manual
RM3542
September 2013 Revised edition 3 RM3542A981-03 13-09H
RM3542-01

Table of Contents

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Hioki RM3542 Specifications

General IconGeneral
CategoryResistance Meter
Measurement Current (selectable)Yes
DisplayLCD
Testing frequency1 kHz
InterfaceRS-232C
Power SupplyAC 100 V to 240 V
Weight2.5 kg

Summary

Task-Oriented Reference

Minimize Measurement Error

Guidance on reducing errors through speed, integration time, and zero adjustment.

Judge Measurement Results

Methods for judging results using comparator functions and comparing instrument settings.

Correct Faulty Measurements

Steps for confirming faulty measurements, improving probe contact, and detecting short circuits.

Chapter 2 Measurement Preparations

2.1 Connecting the Power Cord

Step-by-step instructions for safely connecting the instrument's power cord.

2.2 Connecting Measurement Cables and Test Fixtures

Guidance on connecting measurement cables and test fixtures to the instrument.

Chapter 3 Measurement Settings (Basic Measurements)

3.1 Pre-Operation Inspection

Checklist for verifying instrument and peripheral device condition before operation.

3.3 Setting the Measurement Speed

Describes how to set measurement speed (FAST, MED, SLOW) for precision and noise susceptibility.

3.4 Setting Measurement Start Conditions (Trigger Source)

Details how to configure internal (INT) or external (EXT) triggering for measurement start.

3.5 Selecting the Measurement Range

Explains how to manually select or auto-range measurement settings.

3.6 Zero Adjustment

Procedure for performing zero adjustment to cancel residual resistance.

3.7 Judging Measured Values (Comparator Function)

How to set and use the comparator function for pass/fail judgment based on thresholds.

3.8 Confirming Faulty Measurements

Explains how the instrument detects and displays measurement faults.

Chapter 4 Customizing Measurement Settings

4.4 Checking for Poor or Improper Contact (Contact Check Function)

Details the function to detect poor probe contacts and cable issues.

4.5 Improving Probe Contact (Contact Improver Function)

How to use the Contact Improver function to enhance probe-to-sample contact.

4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)

Explains how to detect unstable voltage conditions during measurement.

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Function to detect short circuits caused by foreign objects between probes.

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

How to compare settings between two instruments to prevent errors.

Chapter 5 System Settings

5.1 Disabling and Enabling Key Operations

Instructions for activating the key-lock function to disable panel keys.

Chapter 6 Storing and Exporting Data

6.1 Storing Data at Specific Times (Data Memory Function)

How to store measured values in internal memory using specific timings.

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Guides on automatically storing stable measurements and its effect on other functions.

6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

How to automatically export measured values to a computer via RS-232C.

Chapter 8 External Control

8.1 External Input/Output Connector and Signals

Details the EXT I/O connector, signals, and safety precautions for external control.

8.4 External I/O Settings

How to configure EOM signal output and trigger signal logic.

Chapter 9 Communications (RS-232C/ GP-IB Interface)

9.4 Configuring the Communications Protocol

Guides on setting up RS-232C and GP-IB protocols and transmission formats.

9.8 Data Exporting Methods

Methods for exporting measured data using Fetch? or Read? commands.

Chapter 10 Specifications

Comparator Function Operation

Explains how the comparator function works, its decision logic, and modes.

ABS Mode Comparator Limits

Defines upper and lower threshold limits for ABS mode comparator settings.

Low-Power Function

Explains the low-power function for measuring sensitive components.

Chapter 10 Specifications (cont.)

Zero Adjustment

Nullifies wiring resistance when measuring with the two-terminal method.

Settings Monitor Function

Compares settings between two instruments, inhibiting measurement if different.

Faulty Measurement Detection

Covers detection of out-of-range values and contact check faults.

Probe Short-Circuit Detection

Function to detect short circuits caused by foreign objects between probe tips.

Contact Improvement Function (Contact Improver)

Applies contact improvement current to enhance probe-to-sample contact.

Data Output Function

Automatically outputs measured values when measurement is finished.

Memory Function

Stores measured values in internal memory, up to 30,000 entries.

Auto-Memory Function

Automatically acquires stable measurements during manual operation.

Measurement Speed

Sets measurement speed to FAST, MED, or SLOW for trade-offs in precision and speed.

Chapter 10 Specifications (cont.)

Resistance Measurement Accuracy

Provides accuracy specifications for resistance measurements under various conditions.

Chapter 11 Maintenance and Service

Troubleshooting

Guides on diagnosing and resolving abnormal operation issues.

Error Displays and Remedies

Lists common error codes and their corresponding remedies.

Appendix 1 Four-Terminal (Voltage-Drop) Method

Four-Terminal Measurement Method

Details the principle of four-terminal measurement for accurate small resistance readings.

Appendix 3 Unstable Measurement Values

Appendix 6 Calibration

Appendix 9 Zero Adjustment

To perform zero adjustment using the instrument

Step-by-step guide for performing zero adjustment via the instrument's interface.

Appendix 9 Zero Adjustment (cont.)

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