Model 6485 Picoammeter Instruction Manual Limit Tests 8-5
Application — A typical application for a 2-stage limit test is to sort a batch of DUT
according to tolerance. For example, you may want to sort diodes (all having the same
nominal value) into three groups, 1%, 5%, and >5%. The limits for limit 1 would be the
5% tolerances, and the limits for limit 2 would be the 1% tolerances. If a diode passes both
tests, it belongs in the 1% group. If it passes limit 1, but fails limit 2, it belongs in the 5%
group. If it fails both tests, it belongs in the >5% group.
Front panel operation
Limit test configuration
Most aspects of limit testing are configured from the limit configuration menu. Once in a
menu structure, use the and keys to display menu items. Use the cursor and and
the and keys to key in values. To change polarity of a value, place the cursor on “+” or
“-” and press either of the or range keys. To change range for the value, place the cur-
sor on the range symbol and scroll using the and range keys (P = pico,
N
= nano, µ =
micro, m = milli, ^ = x1, K = kilo, M = mega, G = giga, T = tera). A menu item or value is
selected by pressing ENTER.
Limits configuration menu
The configuration menu for limits is structured as follows. Bullets denote the main items
of the menu. To access the menu, press CONFIG and then LIMIT.
LIMIT 1 — Configure limit 1 test:
1. CONTROL — Enable or disable limit 1 test.
2. HILIM — Set the HI limit (-9.999999T to +9.999999T).
3. LOLIM — Set the LO limit (-9.999999T to +9.999999T).
LIMIT 2 — Configure limit 2 test:
1. CONTROL — Enable or disable limit 2 test.
2. HILIM — Set the HI limit (-9.999999T to +9.999999T).
3. LOLIM — Set the LO limit (-9.999999T to +9.999999T).
Arm layer configuration menu
To access the menu, press CONFIG and then TRIG. Use the and range keys to scroll
to the ARM menu.
• ARM-IN — Select the “start of test” option:
IMM (Immediate) — Test starts when LIMIT key is pressed.
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