I
Applications Guide
• Measurement considerations — Covers measurement considerations for low current
measurements including Leakage currents and guarding, Input bias current, Voltage bur-
den, Noise and source impedance, Electrostatic interference and shielding, and also
Making connections.
• Applications — Covers applications to measure Diode leakage current, Capacitor leak-
age current, Measuring high resistance with external bias source, Cable insulation resis-
tance, Surface insulation resistance (SIR), Photodiode characterization prior to dicing,
Focused ion beam applications and Using switching systems to measure multiple current
sources as shown in “External triggering,” page 7-11.
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