To Next PageTo Next PageTo Previous PageTo Previous Page
Loading...
Need help?Do you have a question about the Keithley 6485 and is the answer not in the manual?
General| Model | Keithley 6485 |
|---|---|
| Category | Picoammeter |
| Input Impedance | >10^14 Ohms |
| Voltage Burden | <200µV |
| Accuracy | 0.4% of reading |
| Voltage Source Range | Not Applicable |
| Voltage Source Resolution | Not Applicable |
| Voltage Source Accuracy | Not Applicable |
| Interface | IEEE-488 |
| Power Requirements | 100V to 240V AC, 50/60Hz |
| Dimensions | 89 mm high x 214 mm wide x 369 mm deep (3.5 in x 8.4 in x 14.5 in) |
Details the scope and exclusions of the product warranty, including limitations on liability for damages.
Provides a description of the Model 6485 Picoammeter and the manual's content.
Outlines the structure and content of the instruction manual for the Model 6485.
Covers warranty, contact details, safety symbols, and unpacking/inspection procedures.
Summarizes the key features and capabilities of the Model 6485 Picoammeter.
Familiarizes users with the controls, connectors, and display of the instrument.
Details the line power connection, voltage settings, fuse replacement, and power-up sequence.
Explains the instrument's setup configurations including factory, user-defined, and bus defaults.
Describes how SCPI commands are presented and used within the manual.
Details the basic measurement capabilities and ranges of the Model 6485.
Covers factors affecting performance like warm-up period and autozero.
Provides fundamental information on input connections and test circuits.
Explains operation and importance of zero check and zero correct features.
Summarizes factors influencing low-level measurements like noise and shielding.
Details measurement range, reading units, and display resolution selection.
Provides details on reading rate selection and SCPI commands.
Explains configuration and control of digital and median filters.
Explains how to store, recall readings, and use buffer statistics.
Covers SCPI commands for controlling buffer operations.
Explains trigger model components and front panel configuration.
Includes commands to configure the trigger model and control measurements.
Describes external triggering for instrument interaction and synchronization.
Explains basic Limit 1 and Limit 2 testing operations and pass band relationships.
Details how to configure and run limit tests from the front panel.
Covers SCPI commands for remote operation of limit tests.
Explains how to select and configure GPIB or RS-232 interfaces.
Covers GPIB bus standards, connections, commands, and front panel operation.
Provides reference information for RS-232 interface and connections.
Provides an operational overview of the status structure for Model 6485.
Details actions to clear (reset) registers and queues.
Explains how to program enable registers and read status registers.
Explains programming the status byte for service requests (SRQs).
Provides bit identification and command info for status registers.
Details command info on output queue and error queue.
Lists and defines common device commands designated by the IEEE-488.2 standard.
Explains high-level commands to control measurement process and acquire readings.
Covers SCPI commands for controlling the instrument's display.
Covers SCPI commands for configuring data transfer format over the bus.
Covers miscellaneous SCPI commands for system control.
Provides general notes on SCPI syntax, parameters, and command confirmation.
Summarizes environmental, warm-up, and line power requirements for verification.
Lists necessary equipment for verification with pertinent specifications.
Describes calculation of reading limits and provides examples.
Details methods for calculating calibrator voltages for specific ranges.
Summarizes test considerations and restoring factory defaults.
Lists steps to null voltage offset before performing verification.
Details steps for verifying current measurement accuracy across ranges.
Guides users through front panel calibration procedures using test equipment.
Specifies temperature and humidity requirements for calibration.
Lists factors to consider when performing calibration procedures.
States the recommended frequency for unit calibration.
Lists necessary equipment for calibration and its specifications.
Discusses potential error messages that may occur during calibration.
Describes the selections available within the calibration menu.
Provides instructions on how to halt the calibration procedure at any time.
Details calculating currents from calibrator voltages and standard resistors.
Provides step-by-step procedures for calibrating current ranges.
Explains changing, resetting calibration code, and viewing dates/counts.
Describes how to set line voltage and replace the line fuse correctly.
Covers testing the functionality of front panel keys and the display.
Provides detailed technical specifications for the Model 6485 Picoammeter.
Lists and describes various status and error messages encountered during operation.
Covers general considerations for all precision measurements.
Explains how ground loops create error signals and how to prevent them.
Describes triboelectric currents and methods to minimize them.
Explains piezoelectric currents and how to manage mechanical stress.
Discusses error currents from electrochemical effects and humidity impact.
Explains how humidity affects insulation resistance and measurement accuracy.
Discusses testing light-sensitive components in a light-free environment.
Explains electrostatic interference and how it causes unstable readings.
Discusses how magnetic fields generate EMF and how to minimize them.
Covers EMI characteristics and precautions for sensitive measurements.
Explains Device-Dependent Commands (DDC) for Model 6485 via IEEE-488 bus.
Provides example programs (pseudo-code) for achieving speed specifications.
Introduces the IEEE-488 bus as a communication system for electronic devices.
Describes the IEEE-488 bus structure, lines, and device operation categories.
Details the categories of signal lines: data, management, and handshake.
Explains uniline, multiline, common, and SCPI bus commands.
Summarizes IEEE-488.2 standard requirements and SCPI version compliance.
Discusses the 488.1 protocol for increased GPIB speed and its differences with SCPI.
Provides steps to select the 488.1 protocol for remote GPIB control.
Summarizes commands necessary for calibrating the Model 6485 remotely.
Provides an overview of the basic procedure for remote calibration.
Covers measurement considerations for low current measurements.
Covers applications like diode leakage, capacitor leakage, and high resistance measurements.
Explains leakage currents and the use of guarding to improve accuracy.
Discusses input bias current and its effect on low current measurements.
Explains voltage burden and its impact on measurement accuracy.
Details the procedure for performing and saving voltage offset correction.
Discusses how source resistance and capacitance affect noise performance.
Covers electrostatic interference and methods for minimizing it.
Compares shielding and guarding techniques for high impedance circuits.
Provides guidance on making proper connections to avoid measurement errors.
Illustrates voltage transients that occur during picoammeter range changes.
Describes transient voltages expected during up-ranging with input signals.
Compares down-range transients to up-range transients and notes differences.
Provides methods to minimize impact of range change transients.
Explains the transient response when changing zero check mode.
Shows how to measure leakage current for a diode using an external voltage source.
Describes measuring capacitor leakage current dependent on dielectric and voltage.
Covers high resistance measurements using an external voltage source.
Explains measuring cable insulation resistance using source voltage and current.
Describes measuring insulation resistance between PC board traces using a test pattern.
Details characterizing photodiode leakage under various illumination conditions.
Explains use in nanometer-scale imaging, machining, and mapping in semiconductor industry.
Refers to external trigger example for measuring multiple current sources.
