Model 6485 Picoammeter Instruction Manual Status Structure 10-13
Measurement event status
The used bits of the measurement event register (Figure 10-6) are described as follows:
• Bit B1, low limit 1 fail (LL1F) — Set bit indicates that the low limit 1 test has
failed.
• Bit B2, high limit 1 fail (HL1F) — Set bit indicates that the high limit 1 test has
failed.
• Bit B3, low limit 2 fail (LL2F) — Set bit indicates that the low limit 2 test has
failed.
• Bit B4, high limit 2 fail (HL2F) — Set bit indicates that the high limit 2 test has
failed.
• Bit B5, limits pass (LP) — Set bit indicates that all limit tests passed.
• Bit B6, reading available (RAV) — Set bit indicates that a reading was taken and
processed.
• Bit B7, reading overflow (ROF) — Set bit indicates that the reading exceeds the
selected measurement range of Model 6485.
• Bit B8, buffer available (BAV) — Set bit indicates that there are at least two read-
ings in the buffer.
• Bit B9, buffer full (BFL) — Set bit indicates that the buffer is full.
• Bit B10, input overvoltage (IOV) — Set bit indicates there is an input over voltage con-
dition.
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