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Keysight B1505A User’s Guide, Edition 12 5-17

Measurement Examples

Gate Charge Measurement

On-Wafer Auto-Testing Using Resistive Load on the

N1275A

Preparing Measurement Setups

Used Application Tests:

• Qg (R Load High Id + JESD24-2)

• Qg (High Vds + JESD24-2)

• Qg (JESD24-2 High Id + JESD24-2 High Vds)

1. Create a new preset group.

2. Create a test setup for high current gate charge measurement as follows.

a. Open the Qg (R Load High Id + JESD24-2) application test.

b. Set the InCaseOfError parameter to Continue to prevent an abort of the

automatic test execution when an error occurs on a device test. You can set

this in the Extended Setup dialog box opened by the Extended Setup ...

button.

c. Specify an approximate expected total gate charge value to the QgMaxXAxis

parameter and specify an expected threshold voltage to the VgsTh parameter.

d. Specify the On current to the IdOn parameter according to your switching

condition. For the VdsOff parameter, specify the upper limit value to

automatically search for the load voltage when the On current flows to the

active DUT.

e. Specify the measurement range of the gate voltage using the VgsOff and

VgsOn parameters.

f. Save this setup to the preset group created in Step 1.

3. Create a test setup for high voltage gate charge measurement as follows.

a. Open the Qg (High Vds + JESD24-2) application test.