Keysight B1505A User’s Guide, Edition 12 5-13
Measurement Examples
Gate Charge Measurement
Adjusting the Measurement Condition
The charging interval on the gate charge characteristics increases in proportion to
the switching speed. If the charge interval is too long, decrease the gate current Ig.
On-Wafer Auto-Testing Using Current Load Transistor
on the N1275A
Preparing Measurement Setups
Used Application Tests:
• Qg (High Id + JESD24-2)
• Qg (High Vds + JESD24-2)
• Qg (JESD24-2 High Id + JESD24-2 High Vds)
NOTE You can create test setups in random order. This section describes it in the order of
the test sequence.
1. Create a new preset group.
2. Create a test setup for high current gate charge measurement as follows.
a. Open the Qg (High Id + JESD24-2) application test.
b. Set the InCaseOfError parameter to Continue to prevent an abort of the
automatic test execution when an error occurs on a device test. You can set
this in the Extended Setup dialog box opened by the Extended Setup ...
button.
c. Specify an approximate expected total gate charge value to the QgMaxXAxis
parameter and specify an expected threshold voltage to the VgsTh parameter.
d. Specify the Off voltage and On current to the VdsOff and IdOn parameters
according to your switching condition.
e. Specify the measurement range of the gate voltage using the VgsOff and
VgsOn parameters.
f. Specify the gate voltage range of the transistor for the current load using the
LoadVgsOff and LoadVgsOn parameters. For the LoadVgsOff parameter,
specify a gate voltage that the transistor is perfectly turned off. For the
LoadVgsOn parameter, specify a gate voltage that the transistor is perfectly
turned on. Both voltages should be within the maximum rating voltage of the
transistor.
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