8: Testing flash memory Model 4200A-SCS Pulse Card (PGU and PMU)
8-6 4200A-PMU-900-01 Rev. B March 2023
To determine the state of the device, you do a Vg-Id sweep, then perform a calculation to find the
voltage threshold (V
T
). The shift in V
T
represents a change in the amount of charge stored in the
floating gate, which indicates the state of the cell from fully programmed (1) to fully erased (0).
Figure 157: Block diagram of an example flash test setup using a switching matrix
Figure 158: Block diagram of a flash test setup without using a switching matrix (direct
connect)
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