Texas Instruments C2000

ePWM
7 - 28 C2000 Microcontroller Workshop - Control Peripherals
Digital Compare Sub-Module Signals
TZ1
TZ2
TZ3
COMP1OUT
COMP2OUT
COMP3OUT
Digital Trip
Event A1
Compare
Digital Trip
Event A2
Compare
Digital Trip
Event B1
Compare
Digital Trip
Event B2
Compare
Generate PWM Sync
Time-Base Sub-Module
Generate SOCA
Event-Trigger Sub-Module
Trip PWMA Output
Generate Trip Interrupt
Trip-Zone Sub-Module
Generate PWM Sync
Time-Base Sub-Module
Generate SOCB
Event-Trigger Sub-Module
Trip PWMB Output
Generate Trip Interrupt
Trip-Zone Sub-Module
DCAH
DCAL
DCBH
DCBL
DCTRIPSEL TZDCSEL DCACTL / DCBCTL
DCAEVT1
DCAEVT2
DCBEVT1
DCBEVT2
blanking
blanking
The inputs to the digital compare sub-module are the trip zone pins and the analog comparator
outputs. This module generates compare events that can generate a PWM sync, generate an ADC
start of conversion, trip a PWM output, and generate a trip interrupt. Optional blinking can be
used to temporarily disable the compare action in alignment with PWM switching to eliminate
noise effects.
Digital Compare Events
 The user selects the input for each of
DCAH, DCAL, DCBH, DCBL
 Each A and B compare uses its
corresponding DCyH/L inputs (y = A or B)
 The user selects the signal state that
triggers each compare from the following
choices:
i. DCxH  low DCxL  don’t care
ii. DCxH  high DCxL  don’t care
iii. DCxL  low DCxH  don’t care
iv. DCxL  high DCxH  don’t care
v. DCxL  high DCxH  low