Texas Instruments C2000 Workshop Guide And Lab Manual

ePWM
C2000 Microcontroller Workshop - Control Peripherals 7 - 27
ePWM Digital Compare and Trip-Zone Sub-Modules
ePWM Digital Compare and Trip-Zone
Sub-Modules
16-Bit
Time-Base
Counter
Compare
Logic
Action
Qualifier
Dead
Band
PWM
Chopper
Trip
Zone
Shadowed
Compare
Register
Shadowed
Period
Register
Clock
Prescaler
Shadowed
Compare
Register
EPWMxA
EPWMxB
SYSCLKOUT
TZy
EPWMxSYNCI EPWMxSYNCO
TBCLK
Digital
Compare
TZ1-TZ3
COMPxOUT
The trip zone and digital compare sub-modules provide a protection mechanism to protect the
output pins from abnormalities, such as over-voltage, over-current, and excessive temperature
rise.
Purpose of the Digital Compare
Sub-Module
 Generates ‘compare’ events that can:
 Trip the ePWM
 Generate a Trip interrupt
 Sync the ePWM
 Generate an ADC start of conversion
 The inputs to the digital compare module are:
 Analog comparator outputs (COMP1, COMP2, COMP3)
 Trip-zone input pins (TZ1, TZ2, TZ3)
 A compare event is generated when one or more
of its selected inputs are either high or low
(shown
on later slide)

Optional ‘Blanking’ can be used to temporarily
disable the compare action in alignment with
PWM switching to eliminate noise effects

Texas Instruments C2000 Specifications

General

Brand	Texas Instruments
Model	C2000
Category	Microcontrollers
Language	English