XITRON XT2640 - Selecting How the Limits Reference(S) Are Obtained; Configuring and Starting an Assessment

XT2640OperatingManual 13July2016 Page95of187
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18.4.2 SELECTINGHOWTHELIMITSREFERENCE(S)AREOBTAINED
Thesecondbuttonfromtheleftacrossthetopofthescreen(entitledMEASREFSintheimageshownabove)allowsyoutoselectthe
methodusedtoobtainthereferencelevel(s)neededforsettingharmonicslimits.ForEN61000‐3‐2ClassAandBthisselection,
althoughstillpresent,isnotneededasthoseuseabsolutecurrentlimitswhicharenotdependentonanyreferencelevels,allother
classificationsinEN61000‐3‐2andallusesofEN61000‐3‐12requirethishowever.
Changingthisselectionhasanimmediateeffectonthedisplayedassessmentresults.
Note:
ThesamereferencelevelsareappliedtotheassessmentofallphasesoftheEUT.
Thereferencelevelsonlyaffectthelimitsapplied,sodonotaffectthemeasurementsmadeduringanassessment.This
allowsyoutochangethisselectionatanytime.
ThePowerFactorreferenceisdifferenttotheotherreferences,asrequiredbyEN61000‐3‐2,inthatameasuredPFusedas
areferenceisthatobtainedwithinthesamemeasurementperiodasthatforwhichameasuredAmpsreferenceisobtained.
SotheconfiguredPFreferenceisonlyusediftheconfiguredAmpsreferenceisused,andifameasuredAmpsreferenceis
usedthenthePFreferenceissettothePFpresentinthephaseandatthetimeatwhichtheAmpsreferencelevelwas
measured.
Theavailableselectionsare‐
MEASREFS.Whenthisisselectedthereferencelevelsasneededfortheselectedlimitstobeassessedaretakenfromthose
configured(seelaterforconfiguringthereferencelevels)andcanbeoverriddenbythemaximummeasuredlevelsacrossall
phases.AsrequiredbyEN61000‐3‐2and‐12,ifthemaximummeasuredlevelsarewithin±10%oftheconfiguredlevelsthen
theconfiguredlevelsareusedbytheXT2640,otherwisethemaximummeasuredlevelsareusedbytheXT2640.
USERREFS.WhenthisisselectedtheconfiguredreferencelevelsareusedbytheXT2640,regardlessofthemeasuredlevels.
LASTREFS.Whenthisisselectedthereferencelevelspresentatthetimethatthiswasselectedareusedforallfuture
assessmentsuntilthissettingischanged.
Recommendation:
InmostsituationsMEASREFSshouldbeused.OnlywhenindicatedbytheEN61000‐3‐2or‐12standardshouldoneofthe
otherselectionsbeused.
IfyousetzeroforanAmpsorWattsreferencelevelandthenassesstheEUTusingUSERREFSthenMEASREFSwillbeused
forthatreferencelevel.
EN61000‐3‐2ClassDEUTsassessedaccordingtoAnnexC.16.2requirethattheUSERREFSselectionbeusedandthatthe
referencepowerbesetbyyouaccordingtotheequationstatedinthatclause.
Generally,whentheLASTREFStypeofactionisrequired,youshouldperformaninitialassessment(usuallywiththeEUT
initshighestTHCstate)withthissettoMEASREFSandtheassessmentresultsrecordedinthenormalmanner.Thenyou
shouldselectLASTREFSandperformadditionalassessments(withtheEUTindifferingstates)asneeded.Forexample,
whenperformingthedimmedlamptestsEN61000‐3‐2requiresthatthedimmedlevelsbetestedtothesamelimits(i.e.the
usingthesamereferencelevels)asusedfortheinitialundimmedassessment.
18.4.3 CONFIGURINGAND STARTINGANASSESSMENT
TheASSESSbuttonallowsyoutobothconfigureandstartanassessmentofaEUT.
Whenpressed,ascreenisinitiatedwhichallowstoyoutoconfiguretheassessmentwhichwillbeperformed.Anexampleofthis
screenisshownbelow.
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18.4.3.1 CONFIGURINGTH ESUPPLY
TheSUPPLYsectionallowsyoutoconfigurevaluesforthenominalsupplyvoltage(Unom),thenominalsupplyfrequency(Fnom)
andtheRscevaluetouse(ifconfiguredforEN61000‐3‐12measurements,notshownabove).
Note:
ThesesettingsmaybechangedeitherduringorafteranassessmentifdesiredbypressingtheREASSESSbuttonasnoneof
theseaffectthemeasurementsmadeduringanassessment