Reliable Contact Checking (p. 46)
Contact checking (that was previously performed be-
fore and after measuring) is now performed during mea-
surement, so probe bounce and contact resistance
fluctuations can be detected. Contact checking time can
be shortened, improving tact times.
Features
Measurement Circuit Strongly Immune to
Contact Resistance Fluctuations
The effects of contact resistance fluctuations are re-
duced even when scattering occurs near the end of
probe life. Such effects are minimized by the fast re-
sponse of the measurement circuit.
Contact Improver Function (p. 47)
The Contact Improver function improves bad contacts
between probes and test samples. Contacts errors are
reduced by penetrating oxidation and impurities be-
tween probes and samples. Reducing contact errors
can increase productivity and quality. The intensity of
the contact improver function can be adjusted accord-
ing to probe type.
Reject Faulty Data –
Voltage Level Monitor Function (p. 49)
When the contact resistance of the H
CUR
and L
CUR
leads fluctuates, the measurement current changes
momentarily. Such momentary changes are not detect-
able by typical contact checking. The Voltage Level
Monitor function detects a contact error if the detection
voltage changes significantly, which can increase the
reliability of measured values.
Minimize Human Error and Risk –
the Settings Monitor Function (p. 53)
If the settings of two instruments are different, trigger-
ing is inhibited and an alarm notification is generated
to avoid setting mistakes due to human error.
Reliable Four-Terminal Measurement –
Probe Short-Circuit Detection Function
(p. 51)
Four-terminal measurements are inhibited when a
conductive foreign object is present between the
POT and CUR probe tips. Short-circuit probe anoma-
lies are detected by checking the resistance between
these tips when not measuring.
Strong Electrical Noise Immunity
The specified measurement accuracy is achieved
even with ±1.5 kV mixed pulse noise. The floating
measurement section design is highly impervious to
electrical noise, minimizing the effect on measured
values even when turning large-induction motors on
and off. The free-range power supply input (90 to 264
V) is practically unaffected by voltage fluctuations, so
stable measurements are possible even in under
poor power conditions.
Previously
Model
RM3542
Contact Condition
Contact Check
Measuring
Probe Bounce
Contact
Condition
Detection
Voltage
Error
Good Contact
Poor Contact
Excessive detection
voltage fluctuation error
Good Contact
ERROR
Measurement
Status
Contact Check
Contact Condition
Contact Improver
Function
Contact Improvement
Measuring
Checking
ONON
DUT
Foreign object
POT
CUR
DUT electrode
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