Hioki RM3542 - Page 52

4.4 Checking for Poor or Improper Contact (Contact Check Function)
46
This function detects poor contact between the probes and DUT, and broken measurement cables.
The instrument continually monitors the resistance between the H
CUR
and H
POT
probes and the
L
CUR
and L
POT
probes from the start of integration (including response time) and while measuring.
When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi
or C.E. Lo error message appears. No comparator decision is applied to the measured value. When
these error messages appear, check the probe contacts, and check for broken measurement
cables. If the error is not cleared by shorting the tips of a known-good measurement cable, the
instrument requires repair.
• During low-resistance measurement, poor contact of the H
CUR
or L
CUR
probe may be detected as an out-of-
range measurement.
• When contact checking is disabled, measured values may be displayed even when a probe is not contact-
ing the DUT.
4.4 Checking for Poor or Improper Contact
(Contact Check Function)
1
Open the Basic Settings screen.
2
Open the Measurement Settings Screen.
3
Enable the Contact Check function.
4
Select the contact check fault threshold resistance.
5
Return to the Measurement screen.
The Basic Settings screen appears.
The Measurement Settings Screen
appears.
[MEAS SETTINGS]
1
Selection
2
Selection
1
2
Disables the function (go to step 5)
Enables the function (default)
The setting is specific to the selected range
(p. 41)
Selection
1
2
50, 100, 150, 200 (default), 300,
400, 500
A contact fault occurs when a measured
value exceeds the threshold setting.
The confirmation screen appears.
Return to the setting screen.
Save setting and return to
previous screen.
Discard setting and return to
previous screen.