Keysight B1505A User’s Guide, Edition 12 5-15
Measurement Examples
Gate Charge Measurement
c. Qg (JESD24-2 High Id + JESD24-2 High Vds)
Performing the Measurement
Since you need to change the DUT connections between the high current and high
voltage gate charge measurements, perform the quick test twice as follows.
1. Set up the connections for high current gate charge measurement.
2. Perform the first quick test.
a. Turn on the execution flag ( mark) only for the first test setup Qg (High Id
+ JESD24-2) on the Quick Test screen.
b. Click the Repeat button. This opens the Repeat Measurement Setup
dialog box.
c. Specify the prober driver programs to be used to the Start Procedure,
Iteration Procedure, and Final Procedure fields, and then check the
Automatically fill in Device ID.
d. Uncheck the Counter Reaching to in the Repeat Stop Condition area.
e. Click the Run button to start the quick test.
3. Set up the connections for high voltage gate charge measurement.
4. Perform the second quick test.
a. Turn on the execution flag ( mark) for the test setups Qg (High Vds +
JESD24-2) and Qg (JESD24-2 High Id + JESD24-2 High Vds) on the Quick
Test screen.
b. Click the Repeat button. This opens the Repeat Measurement Setup
dialog box.
c. Specify the prober driver programs to be used to the Start Procedure,
Iteration Procedure, and Final Procedure fields, and then check the
Automatically fill in Device ID.
d. Uncheck the Counter Reaching to in the Repeat Stop Condition area.
e. Click the Run button to start the quick test.
NOTE The furnished prober driver programs return the X-Y coordinate data (die index) of
device (chip), and each measurement uses it as Device ID. In Step 2 and 4, each
measurement can use the same Device ID by using the same probing sequence.
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