Keysight B1505A User’s Guide, Edition 12 5-19
Measurement Examples
Gate Charge Measurement
b. Click the Repeat button. This opens the Repeat Measurement Setup
dialog box.
c. Specify the prober driver programs to be used to the Start Procedure,
Iteration Procedure, and Final Procedure fields, and then check the
Automatically fill in Device ID.
d. Uncheck the Counter Reaching to in the Repeat Stop Condition area.
e. Click the Run button to start the quick test.
3. Set up the connections for high voltage gate charge measurement.
4. Perform the second quick test.
a. Turn on the execution flag ( mark) for the test setups Qg (High Vds +
JESD24-2) and Qg (JESD24-2 High Id + JESD24-2 High Vds) on the Quick
Test screen.
b. Click the Repeat button. This opens the Repeat Measurement Setup
dialog box.
c. Specify the prober driver programs to be used to the Start Procedure,
Iteration Procedure, and Final Procedure fields, and then check the
Automatically fill in Device ID.
d. Uncheck the Counter Reaching to in the Repeat Stop Condition area.
e. Click the Run button to start the quick test.
NOTE The furnished prober driver programs return the X-Y coordinate data (die index) of
device (chip), and each measurement uses it as Device ID. In Step 2 and 4, each
measurement can use the same Device ID by using the same probing sequence.
NOTE Qg (JESD24-2 High Id + JESD24-2 High Vds) (for extracting high current and high
voltage gate charge characteristics) inquires the latest high current gate charge
measurement result and the latest high voltage gate charge measurement result using
the specified Device ID.
A maximum of 1000 measurement results for a Device ID can be recorded. They are
kept until the present workspace is closed.
Checking the Measurement Result
After each measurement, the gate charge characteristics will be displayed on the
Data Display window. After all measurements, you can view each measurement
result on the Data Display window.
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