Solver NEXT SPM. Instruction Manual
104
The phase shift distribution over the sample surface visualizes distributions of
characteristics of the sample substance.
The Phase Imaging Mode yields valuable information for a broad area of applications. In
some cases it can uncover hidden contrasts in materials properties. This modeis employed,
for example, in the study of biological objects, samples with electrical and magnetic
properties and a number of other areas.
7.2.3.2. Preparation for Measurements
Before the Phase Imaging measurements, prepare for the measurements and perform
measurements of surface topography by the Semicontact mode (see i. 7.2.1 on page 84).
After the completion of preliminary measurements of surface topography by the
Semicontact Mode, perform setting of parameters for operating by the Phase Imaging
Mode.
7.2.3.3. Scanning
Select the mode SemiContact Phase Contrast from the list Mode (scan mode list) of the
control panel of the scanning window (Fig. 7-73). For this cofiguration, the Phase signal
will be used as the second detection signal for the first scan pass.
Fig. 7-73. Selection of the Phase Imaging Mode
Click the button
Run, which is on the control panel of the scanning window, to trigger the
process of scanning.
The following actions take place:
● Line-by-line scanning of the sample surface starts and two images appear in the field of
2D visualization of the scanning data. One of the images is an image of surface
topography (signal Height), while the other one is the phase distribution (signal Phase)
(Fig. 7-74).
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