Solver NEXT SPM. Instruction Manual
120
7.3.3.2. Preparation for Measurements
To operate in the Electric Force Microscopy Mode a sample should be glued to the
substrate with the conductive glue or mounted on the substrate with a spring contact. And
it should be used conductive probes for semicontact modes.
Preparations of the instrument for operation and measurements in the EFM Mode are
generally similar to those performed in the SemiContact Mode of operations, which are
described in detail in (see i. 7.2.1 on page 84). A sequence of basic procedures, along with
a detailed description of instrument settings and specifics of EFM measurements, is
provided below.
To provide an example of operations in the EFM Mode, we will use a GaAs sample.
Operations in the EFM Mode can be divided into the following sequence of basic
procedures:
1. Preparation for Operation.
2. Preliminary scanning of a sample by the SemiContact Mode.
3. Setting the second-pass scanning parameters.
4. Scanning.
5. Saving Obtained Data.
6. Completion of the Measurements.
Initial state
The following initial procedures are meant to be performed before operations
(see chapter “Preparing for Measurements” on page 29):
● Launch the control program;
● Switch the instrument on;
● Install the conductive probe;
● Adjust the cantilever detection system;
● Mount the sample;
● Install the measuring head;
● Approach the sample to the probe at the distance of 0.5÷1 mm.
Perform preliminary scanning of the sample in the SemiContact Mode (a detailed
description is provided in 7.2.1 on page 84) and select an operating area for EFM
measurements.
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