Chapter 1. Overview
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1. Overview
Solver NEXT is a multifunctional Scanning Probe Microscope of general purpose. It is a
state-of-the-art instrument with highly automated operations. Its digital controller enables a
wide range of SPM techniques. Automatic adjustment of cantilever deflections detection
provides ease-of-operation even for an unexperienced user.
Scanning Probe Microscope is capable to perform measurements with the following
techniques depending on working environment:
In air and in liquid
Atomic Force Microscopy (AFM) (contact; semicontact; non-contact); Lateral Force
Imaging; Phase Imaging Mode; Force Modulation Mode; Adhesion Force Imaging; AFM
Lithography (Force).
In air only
Scanning Tunneling Microscopy (STM); Magnetic Force Microscopy (MFM); Electric
Force Microscopy (EFM); Scanning Capacitance Microscopy (SCM); Kelvin Probe
Microscopy; Spreading Resistance Imaging; Nanosclerometry; AFM Lithography
(Current), STM Lithography.
1.1. Specific Features
The key distinction of the Solver NEXT SPM from its analogues is availability of two
built-in measuring heads (AFM and STM) that are automatically adjusted to their working
position.
Besides, the design of the instrument provides insertion of auxiliary measuring heads.
Currently, the kit of available auxiliary heads includes those for liquid and
nanosclerometric measurements.
The sample can be heated up to 130 °C with the use of the mountable heating stage.
The instrument is equipped with an optical viewing system of high resolution that provides
motorized focusing and zooming. Selection of the scan area is motorized as well.
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