Solver NEXT SPM. Instruction Manual
84
7.2. Semicontact AFM
7.2.1. Semicontact Mode
Operations performed in measurements of surface topography with the Semicontact
Atomic Force Microscopy of different modes have much in common with those of other
techniques based on resonant oscillations of the cantilever.
Initial state
The following steps are assumed to be done:
● Launching the control program;
● Turning the instrument on;
● Installing the probe;
● Adjusting the cantilever deflection detection system;
● Mounting the sample;
● Moving the measuring head to its working position;
● Initial approach;
● Selecting the scan area.
For details on these operations see Ch. 6 Preparing for Measurements on p. 29.
Procedural Sequence
Measurement in a Semicontact mode is arranged in the following procedural sequence:
1. Adjusting the Controller Configuration (see i.. 7.2.1.1 on p. 85)
2. Adjusting Piezodrive Parameters (see i.. 7.2.1.2 on p. 85)
3. Approaching the Sample to the Probe (see i.. 7.2.1.3 on p. 89)
4. Adjusting Working Level of the Feedback Gain (see i.. 7.2.1.4 on p. 91)
5. Adjusting Scanning Parameters (see i.. 7.2.1.5 on p. 92)
6. Scanning (see i.. 7.2.1.6 on p. 97)
7. Saving Measurement Data (see i.. 7.2.1.7 on p. 100)
8. Completing Measurements (see i.. 7.2.1.8 on p. 101)
These procedures are explained below.
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