Waters 2489 - Page 229

Index-9
I
filtering 1-7, 3-16
numerical keys
3-10
O
obtaining
MaxPlot
3-35
RatioPlot
3-34
stored spectrum information
3-56
offset
absorbance
3-12
Auto Zero Offset diagnostic test
5-10
voltage
3-12
operating
as a stand-alone instrument
3-27
detector
3-26–3-65
in dual wavelength mode
1-12,
3-32–3-35
in single wavelength mode
1-11–1-12, 3-31–3-32
modes
3-26
specifications
B-1–B-5
trace and scale functions
3-20–3-22
under remote control
3-27, 3-36
operator interface
3-3
optical
and electronic design
1-4
component specifications
B-3
detector specifications
B-4
filter override diagnostic test
5-11,
5-18
optics
1-4
optional flow cells
4-15
other equipment
configuring with
1-2
connecting to
2-20–2-36
Ethernet connections
2-14–2-15
output
connections
2-10
signals
2-13
overriding the optical filter
5-18
P
pace 3-44
parameters
absorbance threshold timed event
3-37
analog out (dual wavelength)
3-19
AUFS
3-19
auto zero on inject
3-17, 3-19
auto zero on wavelength changes
3-19
auto zero timed event
3-37
chart mark timed event
3-36
chart polarity
3-19
dual wavelength mode
1-13
filter time constant
3-19
lamp timed event
3-37
maximum ratio
3-20
minimum ratio
3-20
polarity timed event
3-36
primary
3-19
ratio minimum AU
3-19
sample and zero scan
3-49
sample scan
3-47–3-51
secondary
3-19
sensitivity timed event
3-36
single wavelength mode
1-11–1-12
SW1 timed event
3-37
SW2 timed event
3-37
time constant timed event
3-36
timed event
3-36
voltage offset
3-19
wavelength
3-19
wavelength timed event
3-36
zero scan
3-47
parts, spare
4-2, C-1
peak response test
3-29
peaks, generating test
5-11, 5-17