3-60 Keysight B1505A User’s Guide, Edition 12
Accessories
The B1505A also provides the following application test definitions.
•GaN FET:
• FET current collapse measurement, IV-t sampling
• FET current collapse measurement, signal monitor
• GaN Diode:
• Diode current collapse measurement, IV-t sampling
• Diode current collapse measurement, signal monitor
Figure 3-21 Connections for GaN Current Collapse Measurement
A
A
HCSMU
MCSMU
for control
Diode switch
Transistor
switch
HVSMU
GNDU
N1267A
A
A
HCSMU
MCSMU
for control
Diode switch
Transistor
switch
HVSMU
GNDU
N1267A
Non-Kelvin connection
Kelvin connection
Do not connect HVSMU and GNDU
Protection Adapter
DUT
MCSMU
for Gate
DUT
MCSMU
for Gate
to N1267A input.
*1) HCSMU is substitutable.
*1
*1