Keysight B1505A User’s Guide, Edition 12 3-61
Accessories
Voltage/Current Source and Measurement Range
Source and measurement range using HVSMU and HCSMU with the N1267A is
shown in Figure 3-22.
Figure 3-22 Source and Measurement Range
For the GaN current collapse measurement, HVSMU applies high voltage stress to
the device under test (DUT) when it is in the OFF state. After that, HVSMU
performs voltage measurement and HCSMU performs I-V measurement to monitor
the ON state characteristics which is given by the voltage measured by HVSMU and
the total current measured by HCSMU and HVSMU.
Source setting values available for HVSMU and HCSMU are shown in Tables 3-8
and 3-9. And measurement ranges are shown in Tables 3-10 and 3-11.
Table 3-8 HVSMU Source Setting Range for OFF State
40
20
40
20
1
1
20
Voltage (V)
Current (A)
-
-
-
HVSMU
1500
3000
0.008
0.004
20
-
Pulse mode only
HCSMU
Pulse mode only
HVSMU/HCSMU switching
for FET measurement
HVSMU/HCSMU switching
for diode measurement
Range
Setting value
a
a. Setting value must be the ON state voltage plus 1 V or more.
Resolution Compliance
200 V 1 V to 200 V 200 V8 mA
500 V 1 V to 500 V 500 V
1500 V 1 V to 1500 V 1.5 mV
3000 V 1 V to 3000 V 3 mV 4 mA
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