Solver NEXT SPM. Instruction Manual
7.1.4.
Contact Error Mode ............................................................................................................ 76
7.1.4.1. Brief Description of the Mode ............................................................................................... 76
7.1.4.2. Preparation for Measurements ............................................................................................... 77
7.1.4.3. Scanning ................................................................................................................................ 77
7.1.5. Piezoresponse Force Microscopy ....................................................................................... 78
7.1.5.1. Brief Description of the Mode ............................................................................................... 78
7.1.5.2. Preparation for Measurements ............................................................................................... 80
7.1.5.3. Adjusting Scanning Parameters ............................................................................................. 81
7.1.5.4. Scanning ................................................................................................................................ 82
7.2. SEMICONTACT AFM ....................................................................................................................... 84
7.2.1. Semicontact Mode ............................................................................................................... 84
7.2.1.1. Adjusting the Controller Configuration ................................................................................. 85
7.2.1.2. Adjusting Piezodrive Parameters .......................................................................................... 85
7.2.1.3. Approaching the Sample to the Probe ................................................................................... 89
7.2.1.4. Adjusting Working Level of the Feedback Gain ................................................................... 91
7.2.1.5. Adjusting Scanning Parameters ............................................................................................. 92
7.2.1.6. Scanning ................................................................................................................................ 97
7.2.1.7. Saving Measurement Data .................................................................................................. 100
7.2.1.8. Completing Measurements .................................................................................................. 101
7.2.2. Semicontact Error Mode ................................................................................................... 101
7.2.2.1. Brief Description of the Mode ............................................................................................. 101
7.2.2.2. Preparation for Measurements ............................................................................................. 102
7.2.2.3. Scanning .............................................................................................................................. 102
7.2.3. Phase Imaging Mode ........................................................................................................ 103
7.2.3.1. Brief Description of the Mode ............................................................................................. 103
7.2.3.2. Preparation for Measurements ............................................................................................. 104
7.2.3.3. Scanning .............................................................................................................................. 104
7.2.3.4. Modes of Improving Image Quality .................................................................................... 105
7.3. MANY-PASS AFM TECHNIQUES ................................................................................................... 106
7.3.1. Magnetic Force Microscopy ............................................................................................. 106
7.3.1.1. Brief Description ................................................................................................................. 106
7.3.1.2. Procedural Sequence ........................................................................................................... 107
7.3.1.3. Adjusting Scanning Parameters ........................................................................................... 108
7.3.1.4. Scanning .............................................................................................................................. 109
7.3.2. Kelvin Probe Microscopy .................................................................................................. 110
7.3.2.1. Brief Description ................................................................................................................. 110
7.3.2.2. Procedural Sequence ........................................................................................................... 112
7.3.2.3. Adjusting Scanning Parameters ........................................................................................... 113
7.3.2.4. Testing SKM Operation Mode ............................................................................................ 113
7.3.2.5. Scanning .............................................................................................................................. 116
7.3.3. Electric Force Microscopy ................................................................................................ 118
7.3.3.1. Brief Description of the Technique ..................................................................................... 118
7.3.3.2. Preparation for Measurements ............................................................................................. 120
7.3.3.3. Adjusting Scanning Parameters ........................................................................................... 121
7.3.3.4. Scanning .............................................................................................................................. 122
7.4. SCANNING TUNNELING MICROSCOPY ........................................................................................... 125
7.4.1. Constant Current Mode .................................................................................................... 125
7.4.1.1. Adjusting the Controller Configuration ............................................................................... 126
7.4.1.2. Approaching the Sample to the Probe ................................................................................. 126
7.4.1.3. Adjusting Working Level of the Feedback Gain ................................................................. 131
7.4.1.4. Adjusting Scanning Parameters ........................................................................................... 132
7.4.1.5. Scanning .............................................................................................................................. 137
7.4.1.6. Saving Measurement Data .................................................................................................. 140
7.4.1.7. Completing Measurements .................................................................................................. 140
7.5. AFM SPECTROSCOPIES ................................................................................................................. 141
7.5.1. Force-distance Spectroscopy ............................................................................................ 141
7.5.1.1. Selecting the Function to be Measured ................................................................................ 142
7.5.1.2. Selecting Points for Spectroscopy ....................................................................................... 144
7.5.1.3. Starting the Measurements .................................................................................................. 147
7.5.1.4. Viewing Spectroscopy Data ................................................................................................ 147
7.5.1.5. Calculating Adhesion Force ................................................................................................ 150
7.5.1.6. Saving Measurement Data .................................................................................................. 152
7.5.2. Amplitude Spectroscopy Mag(Z) ....................................................................................... 152
7.5.2.1. Configuring and Making Measurements ............................................................................. 152
7.5.2.2. Calibration of Cantilever Oscillations Amplitude ............................................................... 154
7.5.3. Current Spectroscopy I(V) ................................................................................................ 156
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