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F
o
1.
2.
3.
4.
5.
6.
7.
o
r making,
t
Check th
a
Open the
In the
Sp
selec
t
selec
t
panel
Redefine
In the fi
e
relation.
which
M
a
Adjust li
m
When co
Mag
(the
minimu
m
probe fu
l
Height
p
cantileve
r
In the
S
p
and back
w
Select th
e
and defi
n
t
he measur
e
a
t
SemiCo
n
F
spectrosco
p
ectroscop
y
t
ing the
Ma
g
t
ing the
H
e
.
the set of
m
e
lds
From
a
n
The range
ag
=
Set P
o
m
its of det
e
mpleting a
m
Min
para
m
m
Mag
valu
e
l
ly withdra
w
arameter c
o
r
or the sca
n
p
eed
group
,
w
ard (
Bac
k
e
mode of
d
n
e the point
s
e
ments co
m
n
tact
is cho
s
F
ig. 7-141.
S
p
y window
Fig.
7
Mode
dro
p
g
signal as
a
e
i
g
ht
as th
e
m
easured si
g
n
d
To
, defi
is defined
o
int
.
e
cting the
M
m
plitude s
p
m
eter) to av
o
e
should b
e
w
n from t
h
o
uld be s
p
n
ner.
,
adjust spe
k
parameter
)
d
efining th
e
s
.
m
plete the f
o
s
en in the c
o
S
electing the
by clickin
g
7
-142. Spect
r
p
-down list,
a
recorded
s
e
argument
g
nals, if ne
c
ne the vari
a
in relative
a
g
signal.
p
ectroscop
y
o
id excessi
v
e
set about
h
e surface.
p
ecified wi
t
eds of taki
n
)
scanning.
e
spectrosc
o
C
o
llowing pr
o
o
ntroller co
controller c
o
g
the
r
oscopy win
d
select
Ma
g
s
ignal in th
e
of the m
e
c
essary.
a
tion range
units with
y
it is critic
a
v
e impact
o
10 % of t
h
With the l
i
t
hout dang
e
n
g 1D relat
o
py points
(
C
hapter 7. P
e
o
cedures:
nfiguration
o
nfiguration
b
utto
n
d
ow
(
Z
)
. This w
i
e
Measure
m
e
asured rel
a
of the arg
u
the origin
a
l to limit
t
o
n the prob
h
e correspo
n
i
mits thus
e
r of dam
a
ions at for
w
(
by points,
b
e
rforming M
e
list (Fig. 7
-
n
.
i
ll result in:
m
ents
pane
l
a
tion in th
e
u
ment of th
at the
Hei
g
t
he minim
u
e and the s
n
ding
Mag
set, any ra
n
a
ging the
s
w
ard (
Forw
b
y a line, o
r
e
asurement
s
15
3
-
141).
l
;
e
A
r
g
umen
t
e measure
d
g
ht
level a
t
u
m value o
f
ample. Th
e
value for
a
n
ge for th
e
s
ample, th
e
parameter
)
r
by a grid
)
s
3
t
d
t
f
e
a
e
e
)
)

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