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CHAPTER 3 CPU MODULE FUNCTIONS
3
3.19 Executional Conditioned Device Test
3.19 Executional Conditioned Device Test
This function changes a device value for the specified step of a program. This enables debugging of the specified
ladder block without modifying the program.
The executional conditioned device test is not available for the SFC program.
(1) Operation of the executional conditioned device test
A device value is changed based on the registration data once the executional conditioned device test setting is
registered.
Note that a device value is changed in the specified step regardless of an execution status of the instruction in the
specified step.
(2) Applicable devices
The following table shows the applicable devices and the number of settable devices.
Type Applicable device
Number of settable
devices
Bit device X (DX), Y (DY), M, L, B, F, SB, V, SM, T (contact), ST (contact), C (contact), FX, and FY
Up to 32 (in total)
Word device
T (current value), ST (current value), C (current value), D, D (extended data register), SD, W, W
(extended link register), SW, R, ZR, Z, U\G, FD
Digit-specified bit device: X, Y, M, L, F, SM, V, B, SB
Indirect specification (@D0): D, SD, W, SW, R, ZR (devices specified with @)
Programming tool
Program
Step number
Device
Setting value
Execution timing
: MAIN
: 10
: M0
: ON
: Before instruction execution
Registration
data
Turns on.
Program : MAIN
879
879
879
880
880880
879
[Program example] [Operation]
Processing
LD M0
10 35
OFF
45
Changes the D0 value to "35".
+ K10 D0
D0 value
M0 value
Register executional conditioned device
test that sets "35" to D0 in this step.
A device value is changed at the specified
step regardless of the M0 value.
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