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Solver NE
X
156
NOTE. It
s
from the
G
scheme (o
p
circuit pa
r
will have t
o
7.5.3.
In current
function
o
BV Value
)
samples.
The
I(V)
p
l
The sampl
adhesive t
coating.
Spectrosc
o
the surfac
e
7.5.3.1.
The prep
a
i. 7.5.1 ”F
o
b
elow. On
l
For makin
g
1. Check
2. Confi
Procee
a. Op
b. In
t
X
T SPM. Inst
r
s
hould be
m
G
ain
p
aram
e
p
ens by cl
i
r
ameters al
s
o
be recali
b
Curren
t
spectrosco
p
o
f the vol
t
. For obvi
o
l
ot provide
s
e is mount
e
ape or wit
h
o
py measur
e
e
using the
c
Confi
g
a
ratory an
d
o
rce-distan
c
l
y the stage
g
, the meas
u
that
Conta
c
g
ure the bl
o
d as follow
s
en the Sca
n
t
he
Mode
li
s
r
uction Man
u
m
entioned t
h
e
ter specifi
e
i
cking
s
o changes
t
b
rated.
t
Spectr
o
p
y the curr
e
t
age appli
e
o
us reasons
,
s
informati
o
e
d on the s
u
h
glue. Me
e
ments cou
c
ontact mo
d
g
uring a
n
d
measur
e
c
e Spectro
s
s that diffe
r
u
rements c
o
c
t
is chosen
Fig. 7-145
o
ck schem
e
s
:
n
ning
wind
o
s
t select
C
o
u
al
h
at the act
u
e
d in the
L
o
). At
t
he calcula
t
o
scopy I
e
nt through
e
d betwee
n
,
current m
e
o
n on local
c
u
bstrate wi
t
asurements
ld be starte
d
e (see i. 7.
1
n
d Maki
n
e
ment pro
c
s
copy” on
p
r
from the s
t
o
mplete th
e
in the cont
r
. Selecting t
h
e
of the in
s
o
w
b
y clicki
n
o
ntact SRI
m
u
al
p
robe o
s
o
c
k
-In
set o
f
the same
t
t
ion coeffic
i
(V)
the probe
(
n
the prob
e
e
asurement
c
onductivit
y
t
h a spring
c
are perfo
r
d
as soon
a
1
“Contact
A
n
g Meas
u
c
edures ar
e
p
. 141. He
n
t
andard pr
o
e
following
p
r
oller confi
g
h
e controlle
r
s
trument fo
n
g the
m
ode (Fig.
7
s
cillations
a
f
parameter
s
t
ime, a mo
d
i
ent. There
f
(
the
IProbe
e
and the
s are only
a
y
of the sa
m
c
ontact an
d
med with
a
a
s the prob
e
A
FM” on p
u
remen
t
e
si
m
ilar
n
ce, just a
o
cedure are
p
rocedures
:
g
uration lis
t
r
configurati
o
r performi
n
b
ut
t
7
-146).
a
mplitude i
s
s
on the ins
d
ification
o
f
ore, the am
p
signal) is
m
sample (t
h
a
pplicable
t
m
ple under
s
d
fixed wit
h
a
probe wi
t
e
has been
a
. 55).
t
s
to those
brief algor
i
considered
:
t
(Fig. 7-14
o
n
n
g current
t
on.
s
independ
e
trument bl
o
o
f the
Loc
k
p
litude sig
n
m
easured a
s
h
e parame
t
t
o conduct
i
s
tudy.
h
double-si
d
t
h conduct
i
a
pproached
discussed
i
thm is gi
v
in detail.
4
1).
spectrosco
p
e
nt
o
ck
k
-In
n
al
s
a
t
er
ng
d
ed
i
ve
to
in
v
en
p
y.

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