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Tektronix CSA7404B - Page 427

Tektronix CSA7404B
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Index
CSA7000B Series & TDS7000B Series Instruments User Manual
Index- 13
period, B--2, Glossary--11
phase, B--2, Glossary--12
pk-pk, B--3
positive duty cycle, B-- 2
positive overshoot, B--3
positive width, B--3
propagation delay, B--1
quality factor, B-- 5
rise time, B-- 3, Glossary-- 14
RMS, B--3, Glossary--14
S/N ratio, B--5
setup, C--11
statistics, 3--146, Glossary--9
stddev, B--3
tracking, Glossary--10
undershoot, Glossary--10
waveform count , B--3
width, Glossary--11, Glossary--12
Measurement accuracy, ensuring maximum,
3--160–3--166
Measurements, C --2
automated, 3--140
Classes of, 3--139
cursor, 3--151
eye diagram, B--6
high and low levels defined, B--6
levels used in taking, B--5, B--6
reference levels defined, B--6
reference le vels defined (eye pattern/optical), B--7
Measuring waveforms, 3--139
absolute re ference, 3--143
access gating, 3-- 150
annotate measurement, 3--146
annotate waveforms on screen, 3--140
annotated display, 3--141
automatic measurements, 3--140
calibrate the oscilloscope, 3-- 161
change cursor position, 3--155
channel, 3--141, 3--142
check the calibration status, 3--161
components determining time cursor readout values,
3--153
connect the probe calibration fixture, 3-- 162
cursor, 3--150
cursor measurements, 3--140
cursor types, 3--151, 3--152
cursor units depend on sources, 3--154
cursors are display limited, 3--152
cursors ignore the selected waveform , 3--152
cursors treat sources independently, 3--153
customize measurements, 3--141
display measurement statistics, 3--146
display the calibration instructions, 3--161
display the cursor controls window, 3--155
enable & position the gates, 3--150
FastFrame, 3--142
gates, 3--141
gating, 3--150
graticule, cursor and automatic measurements,
3--140
high/low method, 3--142
histogram, 3--142, 3--148
histogram counting, 3--158
histogram counting stays on, 3--158
histogram mean, 3--143, 3--148
histogram measurements, 3--160
histogram size, 3--158
horizontal cursors, 3--151
horizontal histogram view and measurement data,
illustrated, 3-- 157
indep, cursor, 3--156
low frequency compensation, 3--163
math waveforms, 3--141, 3--142
max, 3--146
mean, 3--146
measure part of a waveform, 3--141
measurement gating, 3--150
measurement selection, 3--142
measurement sources, 3-- 142
min, 3--146
min-max, 3--143, 3--148
multipurpose knobs, 3--154
noise, 3--143
number of measurements, 3--142
open histogram setup window, 3--158
optimizing measurement accuracy, 3--160
paired cursors, 3--151
reference le vels method, 3--143
reference-level c alculation methods, 3--144
references, 3 --141, 3--142
relative reference, 3--143
remove measurem ents, 3--145
see statistics on measurement results, 3--141
select a cursor type, 3--155
select measurement parameters, 3--141
select measurement sources, 3--141
select the cursor sources, 3--155
select the waveform, 3--145
set cursor style, 3--156
set cursor tracking, 3--156
set display and reset histogram source and type,
3--159
set histogram display options, 3--159
set histogram limit controls, 3-- 160
set measurement reference levels, 3--147, 3 --148
signal type, 3--143

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