Operation
6.2.2.1.2.3 - Advanced: Burst/Fit Pulses per Exposure
Description
Several gate pulses are generated within an exposure. A gate delay is applied that is the same for each exposure in the
series. For each exposure, the external trigger generates the rst gate pulse, subsequent gate pulses are generated
internally via a user dened frequency or period. The maximum number of pulses is applied that can t into the exposure or
the user denes the number of pulses per exposure. Any subsequent triggers that arrive during the exposure are ignored.
Waveforms
Fit to CCD Exposure
Burst per Exposure
External Trigger
Fire
Gate Monitor
ARM
External Trigger
Fire
Gate Monitor
ARM
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