Andor Technology New iStar - Advanced: BurstFit Pulses Per Exposure

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New iStar ICCD
6.2.2.2.2.3 - Advanced: Burst/Fit Pulses per Exposure
Description
Several gate pulses are generated within an exposure. A gate delay is applied that is the same for each exposure
within an accumulated image. The gate delay is also the same for every accumulated image that is returned. For each
exposure, the external trigger generates the rst gate pulse, subsequent gate pulses are generated internally via a user
dened frequency or period. The maximum number of pulses that can t into the exposure is applied, or alternatively the
user denes the numbers of pulses per exposure. Any subsequent triggers that arrive during the exposure are ignored.
Waveforms
Operation
Burst per Exposure
Fit to CCD Exposure
External Trigger
Fire
Gate Monitor
ARM
External Trigger
Fire
Gate Monitor
ARM