Operation
6.2.2.1.4.3 - Advanced: Burst/Fit Pulses per Exposure
Description
Several gate pulses are generated within an exposure. For every successive exposure in the series, the gate delay
applied is incremented by the gate step value. For each exposure, the external trigger generates the rst gate pulse,
subsequent gate pulses are generated internally via a user dened frequency or period. The maximum number of pulses
is applied that can t into the exposure, given the nal gate delay in the series, or the user denes the number of pulses
per exposure. Any subsequent triggers that arrive during the exposure.
Waveforms
Burst per Exposure
Fit to CCD Exposure
External Trigger
Fire
Gate Monitor
ARM
External Trigger
Fire
Gate Monitor
ARM
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