6.2.4.4.3 - Advanced: Burst/Fit Pulses per Exposure
Description
Several gate pulses are generated within an exposure. For every successive exposure in the series, the gate delay
applied is incremented by the gate step value. For each exposure, the external trigger generates the rst gate pulse,
subsequent gate pulses are generated internally via a user dened frequency or period, or the user denes the number
of pulses per exposure. The maximum number of pulses is applied that can t into the exposure, given the nal gate
delay in the series. Any subsequent triggers that arrive during the exposure are ignored.
The external trigger rate cannot exceed 15 kHz.
Operation
Burst per Exposure
External Trigger
Fire
Gate Monitor
ARM
External Trigger
Fire
Gate Monitor
ARM
Fit to CCD Exposure
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