If, for example, the user sets up a Kinetic Series to acquire four scans during the series, with an initial gate delay of
10,000 ps and with variable gate step conditions as shown in the dialog box below, then:
The gate pulse delay will be increased by a gate step of:
1,000 + 5,000 * 1 = 6,000 ps after the rst scan in the kinetic series (i.e. the gate delay changes to 16,000 ps)
The Gate Delay will be increased by a further:
1,000 + 5,000 * 2 = 11,000 ps after the second scan (i.e. the gate delay changes to 27,000 ps)
and by:
1,000 + 5,000 * 3 = 16,000 ps after the third scan (i.e. the gate delay changes to 43,000 ps)
This means that the gate delay for the nal scan in the series is 33,000 ps (6,000 + 11,000 + 16,000) larger than the gate
delay for the rst scan in the series.
Note: In uorescence lifetime measurements, gate delay and gate step parameters can be set to allow a series of
decay curves to be built up automatically.
Note: The Andor Basic command ‘KineticSlice’ allows the extraction of pixel/column signal intensity throughout
a kinetic series, and plots this intensity versus time in a separate display window.
Pre-Acquisition Setup - Image Intensier
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