Sample Application Programs
Flash EEPROM Test
Stress loop
Subprogram \Stress loop" to force write and erase stress is shown below:
2610 Stress_loop:SUB Stress_loop(INTEGER I)
2620 COM @Hp4155,@Form_off,Start_time,End_time
2630 COM /Meas_info/ INTEGER Meas_points,REAL Str,Str_num,Meas_str_num(*)
2640 INTEGER K
2650 REAL Str_end
2660 !
2670 OUTPUT @Hp4155;":STAT:MEAS:EVEN?"
2680 ENTER @Hp4155;K
2690 OUTPUT @Hp4155;":STAT:MEAS:ENAB 267"
2700 !
2710 OUTPUT @Hp4155;":PAGE:SCON:STAN ON"
2720 Str_end=Meas_str_num(I)-1
2730 FOR Str=Str_num TO Str_end
2740 DISP VAL$(Str);"/";VAL$(Meas_str_num(I))
2750 OUTPUT @Hp4155;"MMEM:LOAD:STAT 0,'MEM2','MEMORY';:PAGE:SCON:STR;*WAI"
2760 OUTPUT @Hp4155;"MMEM:LOAD:STAT 0,'MEM3','MEMORY';:PAGE:SCON:STR"
2770 OUTPUT @Hp4155;"*OPC?"
2780 ENTER @Hp4155;A
2790 NEXT Str
2800 !
2810 Str_num=Str
2820 OUTPUT @Hp4155;":PAGE:SCON:STAN OFF"
2830 OUTPUT @Hp4155;":STAT:MEAS:ENAB 0"
2840 SUBEND
Line Description
2670 and 2680 clears the Measurement/Stress Status \Event" register.
2690 enables Bit 0 (A/D Overow), 1 (Oscillation Status), 3 (Compliance
Status), and 8 (PGU Status) of enable mask for the Measurement/Stress
Status \Event" register.
2710 enables standby state so that state does
not
become idle between write
and erase stress. If state becomes idle, the relay will switch after every
write and erase stress, which will damage the relay.
2730 to 2790 repeats forcing write/erase pulses until one write/erase pulse before next
Vth measurement.
2820 disables standby state.
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