HP 4155A Programmer's Guide

Sample Application Programs
Flash EEPROM Test
Stress setup le for write pulse of NAND type.
Stress setup for write pulse of NAND type is stored in \NANWRT.STR" le
on provided diskette. As described previously, you must change line 2010 to
\NANWRT.STR" or your own custom le name.
In the NANWRT.STR le, the following is set up.You can modify these
settings in the NANWRT.STR le or your own le:
 PGUs
Unit Period Width Delay
Time
Peak
Value
Base
Value
Leading
Time
Trailing
Time
Impedance
PGU1 (Gate) 413  s 400  s 0.0 s 20 V 0V 10  s 10  s 50 ohm
Unit Source Impedance
PGU2
1
0V 50 ohm
1 Connected to drain, source, and substrate, and set to
constant source.
Stress setup le for erase pulse of NAND type.
Stress setup for erase pulse of NAND type is stored in \NANERS
.STR" le on
provided diskette. As described previously, you must change line 2020 to
\NANERS.STR" or your own custom le name.
In the NANERS.STR le, the following is set up.You can modify these settings
in the NANERS.STR le or your own le:
 PGUs
Unit Period Width Delay
Time
Peak
Value
Base
Value
Leading
Time
Trailing
Time
Impedance
PGU2
1
5.02 ms 5.00 ms 0.0 s 20 V 0V 10  s 10  s 50 ohm
1 connected to drain, source, and substrate.
Unit Source Impedance
PGU1
1
0V 50 ohm
1 Connected to gate, and set to constant source
6-13

HP 4155A Specifications

General

Brand	HP
Model	4155A
Category	Measuring Instruments
Language	English