Sample Application Programs
Flash EEPROM Test
Program Customization
This section describes how to customize program for your own application.
Subprogram \Test setting".
In this subprogram, you may need to customize the following:
Name of setup les.
If you want to use your own measurement or stress setup les, store the
les on diskette, then modify the le names on the following lines:
Measurement setup le name for Vth measurement.
1980 Vth_file$="ROMVTH.MES" ! Vth Measurement Setup File Name
Stress setup le name for write pulse.
1990 Wrt_file$="NORWRT.STR" ! Write Stress Setup File Name
Stress setup le name for erase pulse.
2000 Ers_file$="NORERS.STR" ! Erase Stress Setup File Name
File name for saving measurement results.
Following two lines create following le name for saving measurement
results:
time
.DAT
.To change this le name, modify these lines:
2010 Save_file$=TIME$(TIMEDATE) ! File Name for saving measurement results
2020 Save_file$=Save_file$[1,2]&Save_file$[4,5]&Save_file$[7,7]&".DAT"
Number of times to repeat measurement (FOR loop of Main Program)
Following line species how many times to measure Vth during stress.
2030 Meas_points=16 ! Number of times to repeat Measurement
Stress pulse count data.
For example,if
Meas_points=4
, a total of ten write/erase pulses are
forced, and Vth is measured after 1st, 2nd, 5th, and 10th pulse
.
2060 Str_num: ! ! Stress Pulse Count data
2070 DATA 1, 2, 5
2080 DATA 10, 20, 50
2090 DATA 100, 200, 500
2100 DATA 1000, 2000, 5000
2110 DATA 10000, 20000, 50000
2120 DATA 100000, 200000, 500000
2130 DATA 1000000
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