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Keysight Technologies B2900 Series

Keysight Technologies B2900 Series
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4-34 Keysight B2900 User’s Guide, Edition 5
Front Panel Reference
Function key group
For the DIO pin assignment, see “Using Digital I/O” on page 3-34.
DIO pins assigned to the GPIO Pins, /BUSY, /SOT, or /EOT must be set to the
DIGITAL I/O function by using the DIO Configuration dialog box.
NOTE Values of GPIO Pins, /BUSY, /SOT, and /EOT
0 to 14 (integer). Numbers 1 to 14 indicate the DIO pins 1 to 14, respectively. 0
indicates that it is not used.
For GPIO Pins, multiple continuous pins are assigned. For example, “1, 2, 3, 4”
indicates that the DIO pins 1 to 4 are assigned. Then LSB is DIO pin 1.
Limit Test Setup dialog box
This dialog box provides the following parameters for setting the limit test, which is
a part of the composite limit test.
Ch Only on 2-channel models. Channel 1 (Ch 1) or 2 (Ch 2)
This field specifies the channel set by this dialog box.
Feed Data Type of data used for the pass/fail judgement of the limit test,
MATH, VOLTS, AMPS, or OHMS.
MATH: Calculation result data of math expression
VOLTS: Voltage measurement data (Vmeas)
AMPS: Current measurement data (Imeas)
OHMS: Resistance data (=Vmeas/Imeas)
For details on using resistance compensation, see “Resistance
Compensation” on page 6-16.
Test Index Index of limit test, No. 1 to 12.
The index numbers 1 to 12 are associated with the bin numbers
1 to 12. See “Limit Test Result dialog box” on page 4-41.
Limit Test Limit test, ON or OFF
Function Test mode, COMPLIANCE (COMP.) or LIMIT
COMPLIANCE: Compliance check
LIMIT: Limit test
Pass Pattern Bit pattern for the limit test pass state. For the SORTING mode.

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