Keysight B2900 User’s Guide, Edition 5 4-33
Front Panel Reference
Function key group
Composite Limit Test Setup dialog box
This dialog box provides the following parameters for setting the limit test.
Ch Only on 2-channel models. Channel 1 (Ch 1) or 2 (Ch 2)
This field specifies the channel set by this dialog box.
Limit Test Composite limit test, ON or OFF
Mode Operation mode, GRADING (GRADE) or SORTING (SORT)
GRADING: Grading mode. See Figure 6-5 for the operation.
SORTING: Sorting mode. See Figure 6-6 for the operation.
Auto Clear Automatic clear of the composite limit test result, ON or OFF
If this parameter is ON, the composite limit test results and the
DIO lines are automatically cleared.
Update Only for the GRADING mode. Test result output timing,
IMMEDIATE (IMM.) or END. See “Immediate?” shown in
Figure 6-5.
IMMEDIATE: Output after every test (Immediate? Yes)
END: Output after the last test (Immediate? No)
Offset Cancel Offset cancel, ON or OFF
If this parameter is ON, the data for the limit test judgement will
be as follows.
Data for judgement = measurement data - offset value
Offset Offset value used for the offset cancel, -9.999999E+20 to
+9.999999E+20
Pass Pattern Bit pattern for the limit test pass state. For the GRADING
mode.
Fail Pattern Bit pattern for the limit test fail state. For the SORTING mode.
GPIO Pins Displays the DIO pins assigned to the bit pattern output. To set
the pins, use the :CALC:DIG:BIT command.
/BUSY DIO pin assigned to the BUSY (busy) signal output
/SOT DIO pin assigned to the SOT (start of test) signal input
/EOT DIO pin assigned to the EOT (end of test) signal output
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