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Tektronix 7613 User Manual

Tektronix 7613
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Circuit
Description—7613/R7613
Service
Pin
6
Pin
10
Trigger
Pin
5
Character
Scan
Pin
16
ov
|
200ps
Z-Axis
Logic
OFF
Command
Pin
14
ewes
LAL)
ov
Vertical
and
Horizontal
Channel
Switch
OFF
Command
Pin
13
Readout
Intensity
Pin
12
NOTE:
Test
oscilloscope
externally
triggered
from
TP2251.
Fig.
3-28.
Output
waveforms
of
Timer
stage.
3-38
Character
Scan
Pin
16
Z-Axis
Logic
OFF
Command
Pin
14
Vertical
and
Horizontal
Channel
Switch
OFF
Command
Pin
13
Readout
Intensity
Pin
12
NOTE:
Test
oscilloscope
externally
triggered
from
1,
Fig.
3-29.
Detail
of
outputs
at
pins
12,
13, 14,
and
16
of
U2126.
to
produce
a
character.
The
collector
of
Q2138
is
also
connected
to
Character
Generator
No.
2,
U2272
through
C2140,
CR2140.
This
activated
U2272
during
the
quiescent
period
of
the
Strobe
pulse
(collector
of
Q2138
negative)
and
diverts
the
output
current
of
Row
Decoder
U2185
to
row
2.
The
purpose
of
this
configuration
is
to
prevent
the
Zeros
Logic
and
Memory
stage
U2232
from
storing
incorrect
data
during
the
quiescent
period
of
the
Strobe
pulse.
When
the
Strobe
pulse
goes
positive,
CR2140
is
reverse
biased
to
disconnect
Q2138
from
U2272
and
allow
the
Row
Decoder
stage
to
operate
in
the
normal
manner.
The
next
signal
to
be
produced
is
the
Vertical/
Horizontal
Channel
Switch
OFF
Command
at
pin
13.
This
positive-going
signal
disconnects
the
plug-in
signals
in
the
vertical
and
horizontal
deflection
systems
so
the
plug-in
units
do
not
control
the
position
of
the
CRT
beam
during
the
readout
display.
The
Ready
signal
derived
from
this
output
is
connected
to
the
Decimal
Point
Logic
and
Character
Position
Counter
stage
and
the
Format
Generator
stage
(see
diagram
11).
The
Readout
Intensity
output
at
pin
12
is
produced
next.
This
current
is
connected
to
the
CRT
Circuit
to
unblank
the
CRT
to
the
intensity
level
deter-
mined
by
READOUT
intensity
control
R2124.
The
Char-
acter
Scan
ramp
at
pin
16
started
to
go
negative
as
this
7613

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Tektronix 7613 Specifications

General IconGeneral
BrandTektronix
Model7613
CategoryTest Equipment
LanguageEnglish

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