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PREPARATION FOR USE
Custom Thermal Test Enclosure
TP04300 Series Interface & Applications Manual 2-51
Custom Thermal Test Enclosure
Custom Thermal
Test Enclosure
(CTTE)
43-CTTE.jpg
Description The CTTE is an enclosure which allows manual probing at temperature of PCBs, component
arrays and small to medium to large subassemblies. One CTTE design option is to utilize
Temptronic’s patented “pierce-through, fog-free window,” a three pane transparent surface
which self heals the original puncture after the probe needle is retracted from the PCB or
subassembly under test. A purge air feature keeps the windows frost-free. A CTTE can be
configured with a “pierce-through, fog-free window” on two sides to allow two operators
simultaneous access, or one operator to access two sides without having to remove, rotate and
reinsert the Device Under Test.
CTTEs can have dimensions measured in feet rather than inches. CTTEs are available for both
edge-connector and in-circuit bed-of-nails PCB test applications and can be configured to meet
a variety of test requirements. Whereas a ThermoFixture holds the module or device in a
custom socket at temperature in an airtight environment and utilizes dual-loop direct DUT
temperature sensing, in a Custom Thermal Test Enclosure, an external DUT sensor at the
exhaust port, using thermocouples, connects to the DUT control of the ThermoStream for
sensing and controlling temperatures. That is, a CTTE simply, precisely, maintains case
temperature, in an ESD-free, frost-free environment, where all tester electronics are isolated
and protected from temperature extremes.
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