Operation
6.2.2.2.4.3 - Burst/Fit Pulses per Exposure
Description
Several gate pulses are generated within an exposure. A gate delay is applied that is the same for each exposure within
an accumulated image. The gate delay is incremented for every accumulated image that is returned. For each exposure,
the external trigger generates the rst gate pulse, subsequent gate pulses are generated internally via a user dened
frequency or period. The maximum number of pulses is applied that can t into the exposure, given the nal gate delay
in the series, or the user denes the numbers of pulses per exposure. Any subsequent triggers that arrive during the
exposure are ignored.
Waveforms
Burst per Exposure
Fit to CCD Exposure
External Trigger
Fire
Gate Monitor
ARM
External Trigger
Fire
Gate Monitor
ARM
To Next Page
Loading...
Need help?
General
