HP 54620A - Page 231

keys
action, 37
function of, 37
menu, 37
softkeys, 37
kit
rackmount, 24–26
training, 24–26
knobs
function of, 37
L
Label, 59–64
label key
used in resetting analyzer, 123
label list
don’t initialize during reset, 123
labeling inputs, 59
labels
and waveform display, 59
assigning, 60–63
auto-increment feature, 63
channel, 38, 40
defining, 62–63
duplicates, 63
initializing, 64
list management, 63
message, 209, 211
preset configuration, 119
settings stored with setup, 117
softkey, 38
turning on or off, 59
Left
time reference position, 83–85
limitations
only one edge in pattern trigger, 73
line switch, 27
line voltage
auto-adjusting for, 27
list
of channels that are off, 39
of disabled channels, 49
of optional accessories, 24–26
of replaceable parts, 193
of supplied accessories, 22–23
list of optional accessories, 25
logic analyzer
accessories supplied with, 22–23
See analyzer
Benchlink for Microsoft Windows, 24–26
carrying case for, 24–26
configuring with Autoscale, 44–45
features of, 52
functional controls, 35–36
keypad, 37
optional accessories, 24–26
preparing for use, 21
process of using, 18, 20
setup, 21
starting acquisition, 46
stopping acquisition, 46
turning on power to, 27
Logic levels, 54, 73
key use to test thresholds, 172
use to test time interval accuracy, 176
logic threshold, 53–55
logical operators
and advanced trigger, 74–79
low-frequency probe circuit, 139–142
LVPS
checking voltages, 165–168
ribbon cable, 166
thermal cut-out circuit, 167
M
magnetic shielding, 24–26
magnification
of delayed sweep, 133
magnify content of sample memory, 80
mail order system
use to replace parts, 191–194
main sweep
Time/div for window, 81
Time/div setting for, 82
main timebase concepts, 133
maintenance, 164
making
dummy load, 158
test connectors, 156–157
making adjustments
for analyzer performance, 159
manuals
supplied, 22–23
margin on external trigger, 109
markers
for delayed sweep window, 81
for trigger position, 84
material list, 22–23
materials
for making test connectors, 156–157
list, 23
measurement
algorithms, 96
features, 52
measurement cycle
See measurement process
measurement field, 38, 41, 92
shows frequency or period, 94–95
shows maximum of 3 measurements, 96
measurement functions
concepts, 137
depend on sample period, 129–138
performance characteristics, 202
measurement process, 18, 20, 92
analyzer setup, 21
measurements
affected by trigger functions, 132
and channels that are off, 49
channel delay, 98
channel-to-channel delay, 92
concepts for making accurate, 128
dual-channel, 92
duty cycle, 96–97
frequency, 96–97
hold time, 92
manual using cursors, 89
period, 96–97
power supply voltages, 161
preset configuration, 119
setup time, 92
single-channel, 91, 96–97
width, 96–97
measuring
fan voltage, 167
frequency or period using cursors, 94–95
hold time, 102–103
LVPS voltages, 168
period using cursors, 91
setup time, 100–101
signals on system board, 166
voltages on power supply, 166
waveform parameters, 96–97
Index
230